National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test by National InstrumentsWelcome, Guest      sign in | register | help


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Research Abstract
National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
by National Instruments

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Published on: July 01, 2003
Type of content: WHITE PAPER
Format: Unknown
Length: 14 pages
Price: FREE

Overview:

By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side. Emphasis on tight timing and synchronization, deep and flexible onboard memory, and fully programmable data transfer cores, makes the SMC an excellent foundation for a mixed-signal modular instrumentation test platform for today and the future.

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